default search action

combined dblp search
author search
venue search
publication search

ask others

E. Kofi Vida-Torku

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

Conference and Workshop Papers

see FAQ

What is the meaning of the colors in the publication lists?

1998
[c8]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/Vida-TorkuJ98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Vida-TorkuJ98
E. Kofi Vida-Torku, George Joos:
Designing for scan test of high performance embedded memories. ITC 1998: 101-108
1995
[c7]
- view
  authority control:
- export record
  dblp key:
  - conf/date/Vida-TorkuMPR95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/Vida-TorkuMPR95
E. Kofi Vida-Torku, Charles H. Malley, Sung Park, R. Reed:
Design and test of the PowerPC 603 microprocessor. ED&TC 1995: 378-384
1994
[c6]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/HunterVL94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/HunterVL94
Craig Hunter, E. Kofi Vida-Torku, Johnny J. LeBlanc:
Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603^TM Microprocessor. ITC 1994: 76-83
1992
[c5]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/Vida-Torku92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Vida-Torku92
E. Kofi Vida-Torku:
Impact of Boundary Scan Design on Delay Test. ITC 1992: 96-105
1986
[c4]
- no documents available
  - no references & citations available
- export record
  dblp key:
  - conf/itc/Vida-TorkuMR86
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Vida-TorkuMR86
E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke:
Performance Assurance of Memories Embedded in VLSI Chips. ITC 1986: 154-160
1983
[c3]
- view
  - electronic edition @ acm.org
  - no references & citations available
- export record
  dblp key:
  - conf/dac/Vida-TorkuR83
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/Vida-TorkuR83
E. Kofi Vida-Torku, Charles E. Radke:
Quality level and fault coverage for multichip modules. DAC 1983: 201-206
[c2]
- view
  - electronic edition @ acm.org
  - no references & citations available
- export record
  dblp key:
  - conf/dac/Vida-TorkuH83
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/Vida-TorkuH83
E. Kofi Vida-Torku, Beverly Messick Huey:
Petri Net based search directing heuristics for test generation. DAC 1983: 323-330
1982
[c1]
- no documents available
  - no references & citations available
- export record
  dblp key:
  - conf/itc/BehARV82
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BehARV82
C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.