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Mathieu Sicre
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Conference and Workshop Papers
- 2023
- [c7]Mathieu Sicre, David Roy, Françis Calmon:
Hot-Carrier Degradation modeling of DCR drift in SPADs. ESSDERC 2023: 61-64 - [c6]Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix:
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. IRPS 2023: 1-8 - [c5]Mathieu Sicre, X. Federspiel, Bastien Mamdy, David Roy, Françis Calmon:
Characterization and modeling of DCR and DCR drift variability in SPADs. IRPS 2023: 1-5 - 2022
- [c4]Mathieu Sicre, Megan Agnew, Christel Buj, Caroline Coutier, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Françis Calmon:
Statistical measurements and Monte-Carlo simulations of DCR in SPADs. ESSCIRC 2022: 193-196 - 2021
- [c3]Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Françis Calmon:
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. ESSCIRC 2021: 143-146 - [c2]Mathieu Sicre, Megan Agnew, Christel Buj, Jean Coignus, Dominique Golanski, Rémi Helleboid, Bastien Mamdy, Isobel Nicholson, Sara Pellegrini, Denis Rideau, David Roy, Françis Calmon:
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study. ESSDERC 2021: 143-146 - [c1]Rémi Helleboid, Denis Rideau, Isobel Nicholson, Norbert Moussy, Olivier Saxod, Marie Basset, Jérémy Grebot, Antonin Zimmerman, Bastien Mamdy, Dominique Golanski, Megan Agnew, Sara Pellegrini, Mathieu Sicre:
Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices. ESSDERC 2021: 271-274
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