"Hot-Carrier Degradation modeling of DCR drift in SPADs."

Mathieu Sicre, David Roy, Françis Calmon (2023)

Details and statistics

DOI: 10.1109/ESSDERC59256.2023.10268534

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-09

a service of  Schloss Dagstuhl - Leibniz Center for Informatics