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Enrique Dehaerne
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Journal Articles
- 2022
- [j1]Enrique Dehaerne
, Bappaditya Dey
, Sandip Halder
, Stefan De Gendt
, Wannes Meert
:
Code Generation Using Machine Learning: A Systematic Review. IEEE Access 10: 82434-82455 (2022)
Conference and Workshop Papers
- 2022
- [c2]Enrique Dehaerne
, Bappaditya Dey
, Sandip Halder:
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 2022: 1-2 - 2020
- [c1]Edoardo Milana
, Bert Van Raemdonck
, Kevin Cornelis, Enrique Dehaerne
, Jef De Clerck, Yarno De Groof, Toon De Vil, Benjamin Gorissen, Dominiek Reynaerts
:
EELWORM: a bioinspired multimodal amphibious soft robot. RoboSoft 2020: 766-771
Informal and Other Publications
- 2023
- [i9]Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt:
Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR abs/2302.09565 (2023) - [i8]MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin:
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR abs/2302.09569 (2023) - [i7]Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt:
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR abs/2304.13840 (2023) - [i6]Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt:
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR abs/2307.15516 (2023) - [i5]Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge:
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR abs/2308.07180 (2023) - [i4]Thibault Lechien
, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt:
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR abs/2308.08376 (2023) - [i3]Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt:
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR abs/2311.11145 (2023) - [i2]Enrique Dehaerne, Bappaditya Dey, Wannes Meert:
A Machine Learning Approach Towards SKILL Code Autocompletion. CoRR abs/2312.01921 (2023) - 2022
- [i1]Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi:
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR abs/2211.02185 (2022)
Coauthor Index
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