"A Comparative Study of Deep-Learning Object Detectors for Semiconductor ..."

Enrique Dehaerne, Bappaditya Dey, Sandip Halder (2022)

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DOI: 10.1109/ICECS202256217.2022.9971022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Enrique Dehaerne, Bappaditya Dey, Sandip Halder:
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 2022: 1-2

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