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Vic De Ridder

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2024
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  - journals/corr/abs-2404-05862
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Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray:
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. CoRR abs/2404.05862 (2024)
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  - journals/corr/abs-2407-10348
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Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge:
Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. CoRR abs/2407.10348 (2024)
2023
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  - journals/corr/abs-2307-08693
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Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge:
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. CoRR abs/2307.08693 (2023)
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  - journals/corr/abs-2308-07180
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Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge:
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR abs/2308.07180 (2023)
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  - journals/corr/abs-2311-11439
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Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge:
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. CoRR abs/2311.11439 (2023)

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