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Yi-Cheng Kung

Yi-Cheng Kong

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2020 – today

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2020
[j1]
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  - journals/tcad/KungLR20
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Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(6): 1340-1345 (2020)

2010 – 2019

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2018
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  - conf/itc/KungLR18
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Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run. ITC 2018: 1-10
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  - conf/itc-asia/KungLR18
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Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run. ITC-Asia 2018: 1-6
2017
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  - conf/ats/ChenKL17
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Chang-Wen Chen, Yi-Cheng Kong, Kuen-Jong Lee:
Test Compression with Single-Input Data Spreader and Multiple Test Sessions. ATS 2017: 28-33

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