"Generating Compact Test Patterns for Stuck-at Faults and Transition Faults ..."

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy (2018)

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DOI: 10.1109/ITC-ASIA.2018.00011

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-12

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Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run. ITC-Asia 2018: 1-6

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