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ORCIDShravan K. Chaganti
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2020 – today
- 2024
[j7]Kushagra Bhatheja
, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen:
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41(3): 21-28 (2024)- 2023
- [j6]Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Des. Test 40(5): 52-61 (2023) - [j5]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39(1): 57-69 (2023) - [c19]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen:
An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. MWSCAS 2023: 59-63 - 2022
- [j4]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38(6): 637-651 (2022) - [c18]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT 2022: 1-6 - [c17]Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS 2022: 1-2 - [c16]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC 2022: 509-513 - [c15]Kushagra Bhatheja, Shravan K. Chaganti, Degang Chen, Xiankun Robert Jin, Chris C. Dao, Juxiang Ren, Abhishek Kumar, Daniel Correa, Mark Lehmann, Thomas Rodriguez, Eric Kingham, Joel R. Knight, Allan Dobbin, Scott W. Herrin, Doug Garrity:
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. ITC 2022: 514-518 - [c14]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS 2022: 1-7 - 2021
- [j3]Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. IEEE Trans. Instrum. Meas. 70: 1-12 (2021) - [c13]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6 - [c12]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS 2021: 1-4 - [c11]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC 2021: 304-308 - 2020
- [j2]Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020) - [c10]Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. VTS 2020: 1-6
2010 – 2019
- 2018
- [j1]Zhiqiang Liu, Shravan K. Chaganti, Degang Chen:
Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(5): 1664-1674 (2018) - [c9]Shravan K. Chaganti, Tao Chen, Yuming Zhuang, Degang Chen:
Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). I2MTC 2018: 1-6 - [c8]Shravan K. Chaganti, Li Xu, Degang Chen:
A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling. ISCAS 2018: 1-5 - [c7]Nanqi Liu, Shravan K. Chaganti, Zhiqiang Liu, Degang Chen, Amitava Majumdar:
Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus. ISCAS 2018: 1-5 - [c6]Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen:
Fast and accurate linearity test for DACs with various architectures using segmented models. ITC 2018: 1-10 - 2017
- [c5]Zhiqiang Liu, Nanqi Liu, Shravan K. Chaganti, Degang Chen, Amitava Majumdar:
A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection. ISCAS 2017: 1-4 - [c4]Shravan K. Chaganti, Li Xu, Degang Chen:
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. VTS 2017: 1-6 - 2016
- [c3]Zhiqiang Liu, Shravan K. Chaganti, Degang Chen:
Toward complete analog fault coverage with minimal observation points using a fault propagation graph. ISCAS 2016: 1282-1285 - [c2]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS 2016: 1-6 - 2015
- [c1]Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS 2015: 1-4
Coauthor Index
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