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"Effect of flicker noise on SEIR for accurate ADC linearity testing."

Yuming Zhuang et al. (2015)

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DOI: 10.1109/MWSCAS.2015.7282187

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Effect of flicker noise on SEIR for accurate ADC linearity testing. MWSCAS 2015: 1-4

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