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Sheng-Jier Yang

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2000 – 2009

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2005
[c2]
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  dblp key:
  - conf/cicc/SheuSYCWCL05
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  persistent URL:
  - https://dblp.org/rec/conf/cicc/SheuSYCWCL05
Yi-Ming Sheu, Ke-Wei Su, Sheng-Jier Yang, Hsien-Te Chen, Chih-Chiang Wang, Ming-Jer Chen, S. Liu:
Modeling well edge proximity effect on highly-scaled MOSFETs. CICC 2005: 831-834
2003
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Ke-Wei Su, Yi-Ming Sheu, Chung-Kai Lin, Sheng-Jier Yang, Wen-Jya Liang, Xuemei Xi, Chung-Shi Chiang, Jaw-Kang Her, Yu-Tai Chia, Carlos H. Diaz, Chenming Hu:
A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics. CICC 2003: 245-248

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