BibTeX records: Sheng-Jier Yang

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@inproceedings{DBLP:conf/cicc/SheuSYCWCL05,
  author    = {Yi{-}Ming Sheu and
               Ke{-}Wei Su and
               Sheng{-}Jier Yang and
               Hsien{-}Te Chen and
               Chih{-}Chiang Wang and
               Ming{-}Jer Chen and
               S. Liu},
  title     = {Modeling well edge proximity effect on highly-scaled MOSFETs},
  booktitle = {Proceedings of the {IEEE} 2005 Custom Integrated Circuits Conference,
               {CICC} 2005, DoubleTree Hotel, San Jose, California, USA, September
               18-21, 2005},
  pages     = {831--834},
  publisher = {{IEEE}},
  year      = {2005},
  url       = {https://doi.org/10.1109/CICC.2005.1568798},
  doi       = {10.1109/CICC.2005.1568798},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/cicc/SheuSYCWCL05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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