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ORCIDNik Sumikawa
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2020 – today
- 2020
[c24]Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa:
Learning A Wafer Feature With One Training Sample. ITC 2020: 1-10
2010 – 2019
- 2019
- [c23]Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa:
Deploying A Machine Learning Solution As A Surrogate. ITC 2019: 1-10 - [c22]Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Wafer Plot Classification Using Neural Networks and Tensor Methods. ITC-Asia 2019: 79-84 - [c21]Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Primitive Concept Identification In A Given Set Of Wafer Maps. VLSI-DAT 2019: 1-4 - [c20]Ahmed Wahba, Li-C. Wang, Zheng Zhang
, Nik Sumikawa:
Wafer Pattern Recognition Using Tucker Decomposition. VTS 2019: 1-6 - 2018
- [c19]Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Concept Recognition in Production Yield Data Analytics. ITC 2018: 1-10 - [i1]Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa:
Discovering Interesting Plots in Production Yield Data Analytics. CoRR abs/1807.03920 (2018) - 2017
- [c18]Nik Sumikawa, Matt Nero, Li-C. Wang:
Kernel based clustering for quality improvement and excursion detection. ITC 2017: 1-10 - [c17]Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg:
Some considerations on choosing an outlier method for automotive product lines. ITC 2017: 1-10 - [c16]Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg:
Learning the process for correlation analysis. VTS 2017: 1-6 - 2016
- [c15]Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6 - 2015
- [c14]Amr Haggag, Nik Sumikawa, Aamer Shaukat:
Reliability/yield trade-off in mitigating "no trouble found" field returns. IOLTS 2015: 174-175 - [c13]Amr Haggag, Nik Sumikawa, Aamer Shaukat, J. K. Jerry Lee, Nick Aghel, Charlie Slayman:
Mitigating "No trouble found" component returns. IRPS 2015: 3 - [c12]Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch:
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10 - 2014
- [c11]Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir:
Multivariate outlier modeling for capturing customer returns - How simple it can be. IOLTS 2014: 164-169 - [c10]Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir:
Yield optimization using advanced statistical correlation methods. ITC 2014: 1-10 - 2013
- [c9]Nik Sumikawa, Li-C. Wang, Magdy S. Abadir:
A pattern mining framework for inter-wafer abnormality analysis. ITC 2013: 1-10 - 2012
- [c8]Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir:
Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD 2012: 101-108 - [c7]Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang:
Functional test content optimization for peak-power validation - An experimental study. ITC 2012: 1-10 - [c6]Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir:
Screening customer returns with multivariate test analysis. ITC 2012: 1-10 - [c5]Nik Sumikawa, Li-C. Wang, Magdy S. Abadir:
An experiment of burn-in time reduction based on parametric test analysis. ITC 2012: 1-10 - [c4]Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang:
Data mining based prediction paradigm and its applications in design automation. VLSI-DAT 2012: 1 - 2011
- [c3]Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir:
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE 2011: 794-799 - [c2]Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir:
Forward prediction based on wafer sort data - A case study. ITC 2011: 1-10 - [c1]Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir:
Understanding customer returns from a test perspective. VTS 2011: 2-7
Coauthor Index
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