"Multidimensional parametric test set optimization of wafer probe data for ..."

Dragoljub Gagi Drmanac et al. (2011)

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DOI: 10.1109/DATE.2011.5763135

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir:
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE 2011: 794-799

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