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ORCIDAndrea Cester
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2020 – today
- 2024
[j18]Sarah Tonello
, Alberto Zacchini, Alessandra Galli, Ata Golparvar, Ali Meimandi, Giacomo Peruzzi, Alessandro Pozzebon, Nicolò Lago, Andrea Cester, Giada Giorgi, Sandro Carrara, Claudio Narduzzi:
Design and in vitro Characterization of a Wearable Multisensing System for Hydration Monitoring. IEEE Trans. Instrum. Meas. 73: 1-11 (2024)- 2023
- [c8]Nicolò Lago, Sara Ruiz Molina, Marta Mas Torrent, Stefano Casalini, Andrea Cester:
Signal amplification properties of Electrolyte-Gated Organic Field-Effect Transistors. MetroInd4.0&IoT 2023: 254-258 - 2022
- [j17]Alessandra Galli, Nicolò Lago, Sarah Tonello, Mario Bortolozzi, Marco Buonomo, Morten Gram Pedersen, Andrea Cester, Giada Giorgi:
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems. IEEE Trans. Instrum. Meas. 71: 1-11 (2022) - 2021
- [c7]Giada Giorgi, Nicolò Lago, Sarah Tonello, Alessandra Galli, M. Buonuomo, Morten Gram Pedersen, Andrea Cester:
RL-EGOFET cell biosensors: A novel approach for the detection of action potentials. MeMeA 2021: 1-6 - 2020
- [c6]Sarah Tonello, Giada Giorgi, Simona Pisu, Andrea Cester:
Organic substrates for novel printed sensors in neural interfacing: a measurement method for cytocompatibility analysis. MeMeA 2020: 1-6
2010 – 2019
- 2018
- [j16]Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester:
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Microelectron. Reliab. 88-90: 878-881 (2018) - [j15]Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester:
Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs. Microelectron. Reliab. 88-90: 882-886 (2018) - 2015
- [j14]Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester:
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectron. Reliab. 55(9-10): 1790-1794 (2015) - [j13]Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs:
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. Microelectron. Reliab. 55(9-10): 1795-1799 (2015) - [c5]Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, Giorgio Cellere:
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS 2015: 3 - [c4]Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo:
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects. IRPS 2015: 3 - 2014
- [j12]Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini:
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. Microelectron. Reliab. 54(9-10): 1638-1642 (2014) - [c3]Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso:
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. ESSDERC 2014: 70-73 - [c2]Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini:
Effects of constant voltage stress on organic complementary logic inverters. ESSDERC 2014: 298-301 - [c1]Davide Bisi, Antonio Stocco, Matteo Meneghini, Fabiana Rampazzo, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni:
Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs. ESSDERC 2014: 389-392 - 2013
- [j11]Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso:
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. Microelectron. Reliab. 53(9-11): 1798-1803 (2013) - [j10]Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Comparison between positive and negative constant current stress on dye-sensitized solar cells. Microelectron. Reliab. 53(9-11): 1804-1808 (2013) - [j9]Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso:
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53(9-11): 1809-1813 (2013) - 2012
- [j8]Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester:
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectron. Reliab. 52(9-10): 2490-2494 (2012) - [j7]Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED. Microelectron. Reliab. 52(9-10): 2495-2499 (2012) - 2011
- [j6]Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester:
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs). Microelectron. Reliab. 51(9-11): 1762-1766 (2011) - 2010
- [j5]Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown:
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED. Microelectron. Reliab. 50(9-11): 1866-1870 (2010)
2000 – 2009
- 2007
- [j4]Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi:
Ionising radiation and electrical stress on nanocrystal memory cell array. Microelectron. Reliab. 47(4-5): 602-605 (2007) - [j3]Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47(9-11): 1349-1352 (2007) - 2006
- [j2]Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46(9-11): 1669-1672 (2006) - 2003
- [j1]S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Ionising radiation effects on MOSFET drain current. Microelectron. Reliab. 43(8): 1247-1251 (2003)
Coauthor Index
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