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Takeshi Nokuo

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2010 – 2019

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2015
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  - conf/irps/OmiyaKSKSNSNSN15
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Masaki Omiya, Shoji Kamiya, Nobuyuki Shishido, Kozo Koiwa, Hisashi Sato, Masahiro Nishida, Takashi Suzuki, Tomoji Nakamura, Toshiaki Suzuki, Takeshi Nokuo:
Scenario for catastrophic failure in interconnect structures under chip package interaction. IRPS 2015: 5
2013
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Masaki Omiya, Kozo Koiwa, Nobuyuki Shishido, Shoji Kamiya, Chuantong Chen, Hisashi Sato, Masahiro Nishida, Takashi Suzuki, Tomoji Nakamura, Toshiaki Suzuki, Takeshi Nokuo:
Experimental and numerical evaluation of interfacial adhesion on Cu/SiN in LSI interconnect structures. Microelectron. Reliab. 53(4): 612-621 (2013)

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