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Journal Articles
- 2010
[j7]M. Fakhri, A.-K. Geinzer, Ralf Heiderhoff
, L. J. Balk:
Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques. Microelectron. Reliab. 50(9-11): 1459-1463 (2010)- 2009
- [j6]A.-K. Tiedemann, K. Kurz, M. Fakhri, Ralf Heiderhoff, J. C. H. Phang, L. J. Balk:
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations. Microelectron. Reliab. 49(9-11): 1165-1168 (2009) - 2008
- [j5]D. Isakov, A. A. B. Tio, T. Geinzer, J. C. H. Phang, Y. Zhang, L. J. Balk:
Near-field detection of photon emission from silicon with 30 nm spatial resolution. Microelectron. Reliab. 48(8-9): 1285-1288 (2008) - 2007
- [j4]A. Pugatschow, Ralf Heiderhoff, L. J. Balk:
Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations. Microelectron. Reliab. 47(9-11): 1529-1533 (2007) - 2006
- [j3]L. J. Balk, W. H. Gerling, E. Wolfgang:
Editorial. Microelectron. Reliab. 46(9-11): 1401-1402 (2006) - 2002
- [j2]T. H. Lee, X. Guo, G. D. Shen, Yuan Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk:
Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM). Microelectron. Reliab. 42(9-11): 1711-1714 (2002) - 2001
- [j1]M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess:
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41(9-10): 1519-1524 (2001)
Coauthor Index
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