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ORCIDP. J. van der Wel
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- affiliation: Philips Semiconductors, Nijmegen, The Netherlands
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2010 – 2019
- 2015
[j7]Maximilian Dammann, Martina Baeumler, Peter Brückner
, Wolfgang Bronner, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle:
Degradation of 0.25 μm GaN HEMTs under high temperature stress test. Microelectron. Reliab. 55(9-10): 1667-1671 (2015)- [j6]Kirsten Rongen, Amar Mavinkurve, M. Chen, P. J. van der Wel, F. Swartjes, Rene T. H. Rongen:
Moisture absorption and desorption in wafer level chip scale packages. Microelectron. Reliab. 55(9-10): 1872-1876 (2015) - 2013
- [j5]P. J. van der Wel, T. Rödle, Benoit Lambert, Hervé Blanck, Maximilian Dammann:
Qualification of 50 V GaN on SiC technology for RF power amplifiers. Microelectron. Reliab. 53(9-11): 1439-1443 (2013)
2000 – 2009
- 2009
- [j4]Maximilian Dammann, W. Pletschen, Patrick Waltereit, Wolfgang Bronner, Rüdiger Quay, Stefan Müller, Michael Mikulla, Oliver Ambacher, P. J. van der Wel, S. Murad, T. Rödle, R. Behtash, F. Bourgeois, K. Riepe, Martin Fagerlind, Einar Örn Sveinbjörnsson:
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. Microelectron. Reliab. 49(5): 474-477 (2009) - 2007
- [j3]P. J. van der Wel, J. R. de Beer, R. J. M. van Boxtel, Y. Y. Hsieh, Y. C. Wang:
Effect of oval defects in GaAs on the reliability of SiNx metal-insulator-metal capacitors. Microelectron. Reliab. 47(8): 1188-1193 (2007) - 2006
- [j2]P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher:
Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Microelectron. Reliab. 46(8): 1279-1284 (2006) - 2001
- [j1]Kris Croes, R. Dreesen, Jean Manca, Ward De Ceuninck, Luc De Schepper, Luc Tielemans, P. J. van der Wel:
High-resolution in-situ of gold electromigration: test time reduction. Microelectron. Reliab. 41(9-10): 1439-1442 (2001)
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