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"Reliability and degradation mechanism of AlGaN/GaN HEMTs for next ..."

Maximilian Dammann et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.02.005

access: closed

type: Journal Article

metadata version: 2021-10-14

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Maximilian Dammann, W. Pletschen, Patrick Waltereit, Wolfgang Bronner, Rüdiger Quay, Stefan Müller, Michael Mikulla, Oliver Ambacher, P. J. van der Wel, S. Murad, T. Rödle, R. Behtash, F. Bourgeois, K. Riepe, Martin Fagerlind, Einar Örn Sveinbjörnsson:
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. Microelectron. Reliab. 49(5): 474-477 (2009)

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