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F. Swartjes

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2010 – 2019

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2015
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  - journals/mr/RongenMCWSR15
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  - https://dblp.org/rec/journals/mr/RongenMCWSR15
Kirsten Rongen, Amar Mavinkurve, M. Chen, P. J. van der Wel, F. Swartjes, Rene T. H. Rongen:
Moisture absorption and desorption in wafer level chip scale packages. Microelectron. Reliab. 55(9-10): 1872-1876 (2015)
2014
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R. T. H. Rongen, R. Roucou, P. J. vd Wel, F. C. Voogt, F. Swartjes, Kirsten Weide-Zaage:
Reliability of Wafer Level Chip Scale Packages. Microelectron. Reliab. 54(9-10): 1988-1994 (2014)

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