Nadine Collaert

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Guido Groeseneken

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Publications

2019
[c16]
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  dblp key:
  - conf/irps/WuFCRRCGLGK19
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  persistent URL:
  - https://dblp.org/rec/conf/irps/WuFCRRCGLGK19
Zhicheng Wu, Jacopo Franco, Dieter Claes, Gerhard Rzepa, Philippe J. Roussel, Nadine Collaert, Guido Groeseneken, Dimitri Linten, Tibor Grasser, Ben Kaczer:
Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling. IRPS 2019: 1-7
2016
[c12]
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  - conf/essderc/VerreckVSCMTG16
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  - https://dblp.org/rec/conf/essderc/VerreckVSCMTG16
Devin Verreck, Anne S. Verhulst, Bart Soree, Nadine Collaert, Anda Mocuta, Aaron Thean, Guido Groeseneken:
Non-uniform strain in lattice-mismatched heterostructure tunnel field-effect transistors. ESSDERC 2016: 412-415
2015
[c7]
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  - conf/irps/JiLBHCAZMIFKZGZ15
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Zhigang Ji, Dimitri Linten, Roman Boschke, Geert Hellings, S. H. Chen, AliReza Alian, D. Zhou, Yves Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, Jianfu Zhang, Weidong Zhang, Nadine Collaert, Guido Groeseneken:
ESD characterization of planar InGaAs devices. IRPS 2015: 3
[c6]
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  - conf/irps/VaisMFLARSCTHGD15
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Abhitosh Vais, Koen Martens, Jacopo Franco, Dennis Lin, AliReza Alian, Philippe Roussel, S. Sioncke, Nadine Collaert, Aaron Thean, Marc M. Heyns, Guido Groeseneken, Kristin De Meyer:
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. IRPS 2015: 5

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