Sule Ozev

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Erkan Acar

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Publications

2010
[j18]
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Erkan Acar, Sule Ozev:
Low Cost MIMO Testing for RF Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(9): 1348-1356 (2010)
[c55]
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  - conf/ets/StratigopoulosMAO10
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Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect filter for alternate RF test. ETS 2010: 265-270
2009
[j17]
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  - journals/tcad/AcarO09
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Erkan Acar, Sule Ozev:
Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(7): 993-1005 (2009)
[c52]
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Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect Filter for Alternate RF Test. ETS 2009: 101-106
[c50]
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  - conf/itc/YilmazNOA09
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Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar:
Built-in EVM measurement for OFDM transceivers using all-digital DFT. ITC 2009: 1-10
2008
[j15]
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  - journals/tcad/AcarO08
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Erkan Acar, Sule Ozev:
Defect-Oriented Testing of RF Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5): 920-931 (2008)
[c45]
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  - conf/itc/AcarOST08
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Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler:
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10
2007
[j10]
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  - journals/tvlsi/AcarO07
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Erkan Acar, Sule Ozev:
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. IEEE Trans. Very Large Scale Integr. Syst. 15(1): 37-47 (2007)
[c38]
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  - conf/iccd/AcarO07
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Erkan Acar, Sule Ozev:
Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. ICCD 2007: 512-517
[c37]
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Erkan Acar, Sule Ozev:
Low cost characterization of RF transceivers through IQ data analysis. ITC 2007: 1-10
[c36]
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  - conf/itc/LiuAO07
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Fang Liu, Erkan Acar, Sule Ozev:
Test yield estimation for analog/RF circuits over multiple correlated measurements. ITC 2007: 1-10
[c34]
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  - conf/vts/AcarOR07
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Erkan Acar, Sule Ozev, Kevin B. Redmond:
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. VTS 2007: 3-8
2006
[c33]
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  - conf/iccad/AcarOR06
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Erkan Acar, Sule Ozev, Kevin B. Redmond:
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. ICCAD 2006: 210-216
[c32]
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  - conf/iccd/AcarO06
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Erkan Acar, Sule Ozev:
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. ICCD 2006: 432-437
2005
[c23]
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  - conf/iccad/AcarO05
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Erkan Acar, Sule Ozev:
Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. ICCAD 2005: 73-79
[c20]
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Erkan Acar, Sule Ozev:
Defect-based RF testing using a new catastrophic fault model. ITC 2005: 9
[c18]
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  - conf/vts/AcarO05
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Erkan Acar, Sule Ozev:
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. VTS 2005: 374-379
2004
[c13]
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  - conf/itc/AcarO04
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Erkan Acar, Sule Ozev:
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792

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