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Publication search results
found 99 matches
- 2022
- Lejla Batina, Shivam Bhasin, Dirmanto Jap, Stjepan Picek:
SCA Strikes Back: Reverse-Engineering Neural Network Architectures Using Side Channels. IEEE Des. Test 39(4): 7-14 (2022) - Sathwika Bavikadi, Abhijitt Dhavlle, Amlan Ganguly, Anand Haridass, Hagar Hendy, Cory E. Merkel, Vijay Janapa Reddi, Purab Ranjan Sutradhar, Arun Joseph, Sai Manoj Pudukotai Dinakarrao:
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms. IEEE Des. Test 39(3): 91-116 (2022) - Bharat Bisht, Shirshendu Das:
BHT-NoC: Blaming Hardware Trojans in NoC Routers. IEEE Des. Test 39(6): 39-47 (2022) - Liton Kumar Biswas, Leonidas Lavdas, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani:
On Backside Probing Techniques and Their Emerging Security Threats. IEEE Des. Test 39(6): 172-179 (2022) - Tulio Pereira Bitencourt, Fábio Luís Livi Ramos, Sergio Bampi:
Power-Saving 8K Real-Time AV1 Arithmetic Encoder Architecture. IEEE Des. Test 39(6): 128-137 (2022) - Michaela Blott, Alina Vasilciuc, Miriam Leeser, Linda Doyle:
Evaluating Theoretical Baselines for ML Benchmarking Across Different Accelerators. IEEE Des. Test 39(3): 28-36 (2022) - Cristiana Bolchini, Ingrid Verbauwhede:
DATE 2022: Aiming for an Online/ Onsite Format and Finally Moving to Online Only. IEEE Des. Test 39(4): 90-93 (2022) - Talita Alves Borges, Vagner Santos Da Rosa, Cristina Meinhardt, Leonardo Bandeira Soares:
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing. IEEE Des. Test 39(2): 31-37 (2022) - Jean Bruant, Pierre-Henri Horrein, Olivier Muller, Tristan Groléat, Frédéric Pétrot:
Toward Agile Hardware Designs With Chisel: A Network Use Case. IEEE Des. Test 39(1): 77-84 (2022) - Geoffrey W. Burr, Sukhwan Lim, Boris Murmann, Rangharajan Venkatesan, Marian Verhelst:
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips. IEEE Des. Test 39(3): 18-27 (2022) - Nicola Capodieci, Paolo Burgio, Roberto Cavicchioli, Ignacio Sañudo Olmedo, Marco Solieri, Marko Bertogna:
Real-Time Requirements for ADAS Platforms Featuring Shared Memory Hierarchies. IEEE Des. Test 39(1): 35-41 (2022) - Stefano Di Carlo:
TTTC News. IEEE Des. Test 39(3): 134-136 (2022) - Mahesh Chandra:
A Novel Method for Scalable VLSI Implementation of Hyperbolic Tangent Function. IEEE Des. Test 39(1): 85-91 (2022) - Mahesh Chandra:
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators. IEEE Des. Test 39(4): 64-70 (2022) - Zhiqiang Chen, Rangyu Deng, Kun Zeng, Xiaoqiang Ni, Hongwei Zhou:
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery. IEEE Des. Test 39(6): 48-57 (2022) - Wei-Hao Chen, Shi-Yu Huang:
On-Chip Jitter Learning for PLL. IEEE Des. Test 39(4): 58-63 (2022) - Yiran Chen, Sherief Reda:
ISLPED 2021: The 25th Anniversary! IEEE Des. Test 39(1): 92-93 (2022) - Chixiao Chen, Jieming Yin, Yarui Peng, Maurizio Palesi, Wenxu Cao, Letian Huang, Amit Kumar Singh, Haocong Zhi, Xiaohang Wang:
Design Challenges of Intrachiplet and Interchiplet Interconnection. IEEE Des. Test 39(6): 99-109 (2022) - Sai Kiran Cherupally, Jian Meng, Adnan Siraj Rakin, Shihui Yin, Mingoo Seok, Deliang Fan, Jae-Sun Seo:
Improving DNN Hardware Accuracy by In-Memory Computing Noise Injection. IEEE Des. Test 39(4): 71-80 (2022) - Victor Oliveira Costa, Carlos Gabriel de Araujo Gewehr, Julio Costella Vicenzi, Everton Alceu Carara, Leonardo Londero de Oliveira:
Dedicated Shapelet Distance Engine for Time-Series Classification. IEEE Des. Test 39(2): 7-14 (2022) - Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna:
Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test 39(5): 17-25 (2022) - Adam Cron, Hailong Jiao, Erik Jan Marinissen:
Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages. IEEE Des. Test 39(5): 5-6 (2022) - Hala Youssef Darweesh, Càndid Reig, Gildas Léger:
Self-Healing of Redundant FLASH ADCs. IEEE Des. Test 39(3): 125-133 (2022) - Scott Davidson:
25 Years (and a Bit More) of The Last Byte. IEEE Des. Test 39(1): 102 (2022) - Scott Davidson:
The Memory Shuffle. IEEE Des. Test 39(2): 131 (2022) - Scott Davidson:
Benchmarking Benchmarking. IEEE Des. Test 39(3): 137 (2022) - Scott Davidson:
Security Arms Race. IEEE Des. Test 39(4): 94 (2022) - Scott Davidson:
Standing on the Shoulders of ... IEEE Des. Test 39(5): 98 (2022) - Scott Davidson:
Small Is Good. IEEE Des. Test 39(6): 180 (2022) - Srini Devadas, Jeyavijayan Rajendran:
Guest Editors' Introduction: Special Issue on 2021 Top Picks in Hardware and Embedded Security. IEEE Des. Test 39(4): 5-6 (2022)
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