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Givargis Danialy 0001

Givargis A. Danialy

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affiliation: Siemens EDA, Wilsonville, OR, USA
affiliation: Siemens Digital Industries Software, Plano, TX, USA

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2020 – today

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2022
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Jean-François Côté, Jeff Fan, Sean Shen, Givargis Danialy, Marcin Lipinski, Michael Garbers, Wu Yang, Martin Keim, Andreas Glowatz, Joe Reynick, Ayush Patel, Joanna Michna:
Affordable and Comprehensive Testing of 3-D Stacked Die Devices. IEEE Des. Test 39(5): 17-25 (2022)
2020
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Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm:
IJTAG Through a Two-Pin Chip Interface. ITC 2020: 1-5

2000 – 2009

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2001
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Stephen K. Sunter, Charles McDonald, Givargis Danialy:
Contactless digital testing of IC pin leakage currents. ITC 2001: 204-210
2000
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Martin Bell, Givargis Danialy, Michael C. Howells, Stephen Pateras:
Bridging the gap between embedded test and ATE. ITC 2000: 55-63

1990 – 1999

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1992
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Satoshi Imai, Takahiro Yamaguchi, Givargis A. Danialy:
Which paradigm can improve the reliability of next-generation measurement system software. OOPSLA Addendum 1992: 153-155

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