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Publication search results
found 81 matches
- 2012
- Yuvraj Agarwal, Anand Raghunathan:
Guest Editors' Introduction: Green Buildings. IEEE Des. Test Comput. 29(4): 5-7 (2012) - Rob Aitken:
Yield Learning Perspectives. IEEE Des. Test Comput. 29(1): 59-62 (2012) - Jaydeep P. Bardhan:
Fast Solvers for Molecular Science and Engineering. IEEE Des. Test Comput. 29(3): 40-48 (2012) - Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann:
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. 29(1): 8-18 (2012) - Sounil Biswas, Bruce Cory:
An Industrial Study of System-Level Test. IEEE Des. Test Comput. 29(1): 19-27 (2012) - R. D. (Shawn) Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku:
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. IEEE Des. Test Comput. 29(1): 36-47 (2012) - Doron Bustan, Dmitry Korchemny, Erik Seligman, Jin Yang:
SystemVerilog Assertions: Past, Present, and Future SVA Standardization Experience. IEEE Des. Test Comput. 29(2): 23-31 (2012) - Jake Buurma, Robert Sayah, Fred Valente, Cathy Rodgers:
OpenDFM Bridging the Gap Between DRC and DFM. IEEE Des. Test 29(6): 84-90 (2012) - Susan Carver, Anmol Mathur, Lalit Sharma, Prasad Subbarao, Steve Urish, Qi Wang:
Low-Power Design Using the Si2 Common Power Format. IEEE Des. Test Comput. 29(2): 62-70 (2012) - Krishnendu Chakrabarty:
The Quest for High-Yield IC Manufacturing. IEEE Des. Test Comput. 29(1): 4 (2012) - Krishnendu Chakrabarty:
Standards, Interoperability, and Innovation in a Disaggregated IC Industry. IEEE Des. Test Comput. 29(2): 4 (2012) - Krishnendu Chakrabarty:
Looking ahead at the role of electronic design automation in synthetic biology [From the EIC]. IEEE Des. Test Comput. 29(3): 4 (2012) - Krishnendu Chakrabarty:
Electronic Design Methods and Technologies for Green Buildings. IEEE Des. Test Comput. 29(4): 4 (2012) - Krishnendu Chakrabarty:
Towards more digital content in wireless systems [From the EiC]. IEEE Des. Test Comput. 29(6): 4 (2012) - Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barcelo, Roberto Gómez, Chuck Hawkins, Jaume Segura:
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29(4): 80-91 (2012) - Satrajit Chatterjee, Michael Kishinevsky, Ümit Y. Ogras:
xMAS: Quick Formal Modeling of Communication Fabrics to Enable Verification. IEEE Des. Test Comput. 29(3): 80-88 (2012) - Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao:
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors. IEEE Des. Test Comput. 29(5): 18-26 (2012) - Charles Chien, Adrian Tang, Frank Hsiao, Mau-Chung Frank Chang:
Dual-Control Self-Healing Architecture for High-Performance Radio SoCs. IEEE Des. Test 29(6): 40-51 (2012) - Scott Davidson:
Yield of Black Swans. IEEE Des. Test Comput. 29(1): 80 (2012) - Scott Davidson:
A World Without Standards. IEEE Des. Test Comput. 29(2): 112 (2012) - Scott Davidson:
At the beginning. IEEE Des. Test Comput. 29(3): 51 (2012) - Scott Davidson:
Energy Efficiency Like Your Momma Used to Make. IEEE Des. Test Comput. 29(4): 61 (2012) - Stephen Dawson-Haggerty, Jorge Ortiz, Jason Trager, David E. Culler, Randy H. Katz:
Energy Savings and the "Software-Defined" Building. IEEE Des. Test Comput. 29(4): 56-57 (2012) - Douglas Densmore, Soha Hassoun:
Guest Editors' Introduction: Synthetic Biology. IEEE Des. Test Comput. 29(3): 5-6 (2012) - Douglas Densmore, Soha Hassoun:
Design Automation for Synthetic Biological Systems. IEEE Des. Test Comput. 29(3): 7-20 (2012) - Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012) - Nagu R. Dhanwada, David J. Hathaway, Jerry Frenkil, W. Rhett Davis, Harun Demircioglu:
Leakage Power Contributor Modeling. IEEE Des. Test Comput. 29(2): 71-78 (2012) - Stephan Eggersglüß, Rolf Drechsler:
A Highly Fault-Efficient SAT-Based ATPG Flow. IEEE Des. Test Comput. 29(4): 63-70 (2012) - Bill Eklow:
Managing Complex Boundary-Scan Operations. IEEE Des. Test Comput. 29(2): 100-102 (2012) - Nick English, Yatin Trivedi:
Standards and Collaboration Perspectives: Yesterday, Today, and Tomorrow [Perspectives]. IEEE Des. Test Comput. 29(2): 89-92 (2012)
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