- Sai Manoj Pudukotai Dinakarrao, Arun Joseph, Amlan Ganguly, Anand Haridass, Vijay Janappa Reddi:
Guest Editors' Introduction: Special Issue on Benchmarking Machine Learning Systems and Applications. IEEE Des. Test 39(3): 5-7 (2022) - Cláudio Machado Diniz, Bruno Zatt:
Guest Editors' Introduction: SBCCI 2021. IEEE Des. Test 39(6): 110 (2022) - Harry Foster, Rob Oshana, Jörg Henkel, Vivek De:
Report on the Design Automation Conference (DAC 2021). IEEE Des. Test 39(1): 97-99 (2022) - Freddy Gabbay, Avi Mendelson, Basel Salameh, Majd Ganaiem:
A Design Flow and Tool for Avoiding Asymmetric Aging. IEEE Des. Test 39(6): 111-118 (2022) - Dinesh Ganesan, Binsu J. Kailath:
Graph-Based Circuit Simulator for Switched Capacitor Circuits. IEEE Des. Test 39(4): 81-89 (2022) - Andreas Gerstlauer, Aviral Shrivastava:
Report on the 2021 Embedded Systems Week (ESWEEK). IEEE Des. Test 39(1): 94-96 (2022) - Reza Ghanaatian, Marco Widmer, Andreas Burg:
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness. IEEE Des. Test 39(2): 112-120 (2022) - Ilias Giechaskiel, Kasper Rasmussen, Ken Eguro:
Long-Wire Leakage: The Threat of Crosstalk. IEEE Des. Test 39(4): 41-48 (2022) - Jiovana Sousa Gomes, Tulio Pereira Bitencourt, Sergio Bampi, Fábio Luís Livi Ramos:
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder. IEEE Des. Test 39(6): 119-127 (2022) - Amira Guesmi, Ihsen Alouani, Mouna Baklouti, Tarek Frikha, Mohamed Abid:
SIT: Stochastic Input Transformation to Defend Against Adversarial Attacks on Deep Neural Networks. IEEE Des. Test 39(3): 63-72 (2022) - David Harel, Assaf Marron, Joseph Sifakis:
Creating a Foundation for Next-Generation Autonomous Systems. IEEE Des. Test 39(1): 49-56 (2022) - Jiaji He, Xiaolong Guo, Mark M. Tehranipoor, Apostol Vassilev, Yier Jin:
EM Side Channels in Hardware Security: Attacks and Defenses. IEEE Des. Test 39(2): 100-111 (2022) - Jörg Henkel:
Designing Autonomous Systems. IEEE Des. Test 39(1): 4 (2022) - Weizhe Hua, Zhiru Zhang, G. Edward Suh:
Reverse-Engineering CNN Models Using Side-Channel Attacks. IEEE Des. Test 39(4): 15-22 (2022) - Qingrong Huang, Dayane Reis, Chao Li, Di Gao, Michael T. Niemier, Xiaobo Sharon Hu, Mohsen Imani, Xunzhao Yin, Cheng Zhuo:
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic. IEEE Des. Test 39(2): 56-64 (2022) - Hongwu Jiang, Wantong Li, Shanshi Huang, Stefan Cosemans, Francky Catthoor, Shimeng Yu:
Analog-to-Digital Converter Design Exploration for Compute-in-Memory Accelerators. IEEE Des. Test 39(2): 48-55 (2022) - Michael Guilherme Jordan, Guilherme Korol, Tiago Knorst, Mateus Beck Rutzig, Antonio Carlos Schneider Beck:
ERIN: Energy-Aware Resource-Provisioning Framework for CPU-FPGA Multitenant Environment. IEEE Des. Test 39(6): 138-146 (2022) - Julio Saraçol Domingues Júnior, Leomar Soares da Rosa Jr., Felipe de Souza Marques:
Migortho: A Design Automation Flow for QCA Circuits. IEEE Des. Test 39(2): 23-30 (2022) - Andrew B. Kahng, Minsoo Kim, Seungwon Kim, Mingyu Woo:
RosettaStone: Connecting the Past, Present, and Future of Physical Design Research. IEEE Des. Test 39(5): 70-78 (2022) - Donghyun Kang, Soonhoi Ha:
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently. IEEE Des. Test 39(5): 54-61 (2022) - M. Shafkat M. Khan, Chengjie Xi, Aslam A. Khan, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani:
Secure Interposer-Based Heterogeneous Integration. IEEE Des. Test 39(6): 156-164 (2022) - Hao Kong, Shuo Huai, Di Liu, Lei Zhang, Hui Chen, Shien Zhu, Shiqing Li, Weichen Liu, Manu Rastogi, Ravi Subramaniam, Madhu Athreya, M. Anthony Lewis:
EDLAB: A Benchmark for Edge Deep Learning Accelerators. IEEE Des. Test 39(3): 8-17 (2022) - Charalambos Konstantinou, Xueyang Wang, Prashanth Krishnamurthy, Farshad Khorrami, Michail Maniatakos, Ramesh Karri:
HPC-Based Malware Detectors Actually Work: Transition to Practice After a Decade of Research. IEEE Des. Test 39(4): 23-32 (2022) - Jonas Krautter, Dennis R. E. Gnad, Mehdi B. Tahoori:
Remote Fault Attacks in Multitenant Cloud FPGAs. IEEE Des. Test 39(4): 33-40 (2022) - Neiel Leyva, Alireza Monemi, Enrique Vallejo:
SynFull-RTL: Evaluation Methodology for RTL NoC Designs. IEEE Des. Test 39(6): 58-69 (2022) - Hai Li, Alaa R. Alameldeen, Onur Mutlu:
Guest Editors' Introduction: Near-Memory and In-Memory Processing. IEEE Des. Test 39(2): 46-47 (2022) - Zhenmin Li, Yuqing Ma, Gaoming Du, Xiaolei Wang, Yukun Song, Duoli Zhang:
RB-OLITS: A Worst Case Reorder Buffer Size Reduction Approach for 3-D-NoC. IEEE Des. Test 39(6): 79-89 (2022) - Aditya Lohana, Ansh Rupani, Shubham Rai, Akash Kumar:
Efficient Privacy-Aware Federated Learning by Elimination of Downstream Redundancy. IEEE Des. Test 39(3): 73-81 (2022) - Hao Luan, Yu Yao, Chang Huang:
A Many-Ported and Shared Memory Architecture for High-Performance ADAS SoCs. IEEE Des. Test 39(6): 5-15 (2022) - Haoran Lyu, Fengwei An, Shirui Zhao, Wei Mao, Hao Yu:
A 703.4-GOPs/W Binary SegNet Processor With Computing-Near-Memory Architecture for Road Detection. IEEE Des. Test 39(2): 74-83 (2022)