- Gilles Micolau, Hassen Aziza, Karine Castellani-Coulié, Jean-Michel Portal:
Impact of SEU configurations on a SRAM cell response at circuit level. LATW 2011: 1-5 - José Augusto Miranda Nacif, Thiago S. F. Silva, Luiz Filipe M. Vieira, Alex Borges Vieira, Antônio Otávio Fernandes, Claudionor Nunes Coelho:
A cache based algorithm to predict HDL modules faults. LATW 2011: 1-3 - R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira:
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications. LATW 2011: 1-6 - Alfredo Olmos, Andre Vilas Boas, Eduardo Ribeiro da Silva, José Carlos da Silva, Ricardo Maltione:
Impact of RF-based fault injection in Pierce-type crystal oscillators under EMC standard tests in microcontrollers. LATW 2011: 1-8 - Samuel Nascimento Pagliarini, Paulo André Haacke, Fernanda Lima Kastensmidt:
Evaluating coverage collection using the VEasy functional verification tool suite. LATW 2011: 1-6 - Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi:
Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis. LATW 2011: 1-6 - Pablo A. Petrashin, Carlos Dualibe:
An improved OBT strategy for untuned continuous-time analog filters. LATW 2011: 1-5 - Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas:
Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study. LATW 2011: 1-6 - Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet:
Test and calibration of MEMS convective accelerometers with a fully electrical setup. LATW 2011: 1-6 - Sven Rosinger, Malte Metzdorf, Domenik Helms, Wolfgang Nebel:
Behavioral-level thermal- and aging-estimation flow. LATW 2011: 1-6 - Andreia M. dos Santos, Börje F. Karlsson, André M. Cavalcante, Igor B. Correia, Emanuel Silva:
Testing in an agile product development environment: An industry experience report. LATW 2011: 1-6 - Jorge Arturo Corso Sarmiento, Francisco Javier Ramirez Fernandez:
Methodology and platform for fault co-emulation. LATW 2011: 1-6 - Sebastian Siegl, Kai-Steffen Hielscher, Reinhard German, Christian Berger:
Automated testing of embedded automotive systems from requirement specification models. LATW 2011: 1-6 - Suraj Sindia, Vishwani D. Agrawal, Virendra Singh:
Testing linear and non-linear analog circuits using moment generating functions. LATW 2011: 1-6 - Jimmy Tarrillo, Raul Chipana, Eduardo Chielle, Fernanda Lima Kastensmidt:
Designing and analyzing a SpaceWire router IP for soft errors detection. LATW 2011: 1-6 - András Timár, Márta Rencz:
Studying the influence of chip temperatures on timing integrity. LATW 2011: 1-5 - Jorge L. Tonfat, Gustavo Neuberger, Ricardo Reis:
Functional verification of logic modules for a Gigabit Ethernet switch. LATW 2011: 1-4 - Frank Sill Torres, Claas Cornelius, Dirk Timmermann:
Reliability enhancement via Sleep Transistors. LATW 2011: 1-6 - María Dolores Valdés, Judit Freijedo, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects. LATW 2011: 1-7 - Raoul Velazco, Gilles Foucard, Fabrice Pancher, Wassim Mansour, Greicy Marques-Costa, Devan Sohier, Alain Bui:
Robustness with respect to SEUs of a self-converging algorithm. LATW 2011: 1-5 - 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. IEEE 2011, ISBN 978-1-4577-1488-7 [contents]