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"Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis."

Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi (2011)

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DOI: 10.1109/LATW.2011.5985896

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

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  dblp key:
  - conf/latw/PascaAB11
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Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi:
Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis. LATW 2011: 1-6

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