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"On methods to match a test pattern generator to a circuit-under-test."
Irith Pomeranz, Sudhakar M. Reddy (1998)
- Irith Pomeranz, Sudhakar M. Reddy:
On methods to match a test pattern generator to a circuit-under-test. IEEE Trans. Very Large Scale Integr. Syst. 6(3): 432-444 (1998)
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