"Random Test Generation With Input Cube Avoidance."

Irith Pomeranz, Sudhakar M. Reddy (2009)

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DOI: 10.1109/TVLSI.2008.2001943

access: closed

type: Journal Article

metadata version: 2020-03-11

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Irith Pomeranz, Sudhakar M. Reddy:
Random Test Generation With Input Cube Avoidance. IEEE Trans. Very Large Scale Integr. Syst. 17(1): 45-54 (2009)

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