"Improving the stuck-at fault coverage of functional test sequences by ..."

Irith Pomeranz, Sudhakar M. Reddy (2004)

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DOI: 10.1109/TVLSI.2004.830910

access: closed

type: Journal Article

metadata version: 2020-03-11

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Irith Pomeranz, Sudhakar M. Reddy:
Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. IEEE Trans. Very Large Scale Integr. Syst. 12(7): 780-788 (2004)

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