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"Bias-Dependent Variation in FinFET SRAM."

Randy W. Mann et al. (2020)

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DOI: 10.1109/TVLSI.2020.2974202

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - journals/tvlsi/MannZKCPKHVC20
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  - https://dblp.org/rec/journals/tvlsi/MannZKCPKHVC20
Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter:
Bias-Dependent Variation in FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 28(5): 1341-1344 (2020)

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