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"Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction."

Shraddha Bodhe et al. (2017)

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DOI: 10.1109/TVLSI.2016.2628321

access: closed

type: Journal Article

metadata version: 2020-03-11

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  dblp key:
  - journals/tvlsi/BodhePAV17
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/BodhePAV17
Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman:
Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1497-1505 (2017)

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