"On test data volume reduction for multiple scan chain designs."

Sudhakar M. Reddy et al. (2003)

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DOI: 10.1145/944027.944031

access: closed

type: Journal Article

metadata version: 2018-11-06

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Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz:
On test data volume reduction for multiple scan chain designs. ACM Trans. Design Autom. Electr. Syst. 8(4): 460-469 (2003)

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