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"Static test compaction for synchronous sequential circuits based on vector ..."

Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo (1999)

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DOI: 10.1109/43.771184

access: closed

type: Journal Article

metadata version: 2024-08-04

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Irith Pomeranz, Sudhakar M. Reddy, Ruifeng Guo:
Static test compaction for synchronous sequential circuits based on vector restoration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(7): 1040-1049 (1999)

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