"Improved n-Detection Test Sequences Under Transparent Scan."

Irith Pomeranz, Sudhakar M. Reddy (2006)

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DOI: 10.1109/TCAD.2006.881334

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Improved n-Detection Test Sequences Under Transparent Scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2492-2501 (2006)

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