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"Generation of Functional Broadside Tests for Transition Faults."

Irith Pomeranz, Sudhakar M. Reddy (2006)

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DOI: 10.1109/TCAD.2005.860959

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Generation of Functional Broadside Tests for Transition Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2207-2218 (2006)

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