"Scan-BIST based on transition probabilities for circuits with single and ..."

Irith Pomeranz, Sudhakar M. Reddy (2006)

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DOI: 10.1109/TCAD.2005.854634

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Scan-BIST based on transition probabilities for circuits with single and multiple scan chains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(3): 591-596 (2006)

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