default search action
"Test compaction for at-speed testing of scan circuits based onnonscan ..."
Irith Pomeranz, Sudhakar M. Reddy (2002)
- Irith Pomeranz, Sudhakar M. Reddy:
Test compaction for at-speed testing of scan circuits based onnonscan test. sequences and removal of transfer sequences. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 706-714 (2002)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.