"Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks."

Irith Pomeranz (2024)

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DOI: 10.1109/TCAD.2023.3307352

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type: Journal Article

metadata version: 2024-01-13

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Irith Pomeranz:
Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(1): 394-402 (2024)

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