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"Cost-effective generation of minimal test sets for stuck-at faults in ..."

Seiji Kajihara et al. (1995)

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DOI: 10.1109/43.476580

access: closed

type: Journal Article

metadata version: 2020-09-24

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Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy:
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(12): 1496-1504 (1995)

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