"On Maximizing the Fault Coverage for a Given Test Length Limit in a ..."

Irith Pomeranz, Sudhakar M. Reddy (2004)

> Home

Details and statistics

DOI: 10.1109/TC.2004.63

access: closed

type: Journal Article

metadata version: 2017-05-20

- view
  authority control:
- export record
  dblp key:
  - journals/tc/PomeranzR04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/PomeranzR04
Irith Pomeranz, Sudhakar M. Reddy:
On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential Circuit. IEEE Trans. Computers 53(9): 1121-1133 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.