"Test Schedules for VLSI Circuits Having Built-In Test Hardware."

Magdy S. Abadir, Melvin A. Breuer (1986)

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DOI: 10.1109/TC.1986.1676771

access: closed

type: Journal Article

metadata version: 2017-05-20

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Magdy S. Abadir, Melvin A. Breuer:
Test Schedules for VLSI Circuits Having Built-In Test Hardware. IEEE Trans. Computers 35(4): 361-367 (1986)

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