"A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for ..."

Seung-Hwan Song, Ki Chul Chun, Chris H. Kim (2014)

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DOI: 10.1109/JSSC.2014.2314445

access: closed

type: Journal Article

metadata version: 2020-08-30

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Seung-Hwan Song, Ki Chul Chun, Chris H. Kim:
A Bit-by-Bit Re-Writable Eflash in a Generic 65 nm Logic Process for Moderate-Density Nonvolatile Memory Applications. IEEE J. Solid State Circuits 49(8): 1861-1871 (2014)

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