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"Design-for-testability to achieve complete coverage of delay faults in ..."
Irith Pomeranz, Sudhakar M. Reddy (2001)
- Irith Pomeranz, Sudhakar M. Reddy:
Design-for-testability to achieve complete coverage of delay faults in standard full scan circuits. J. Syst. Archit. 47(3-4): 357-373 (2001)
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