"Static test compaction for diagnostic test sets of full-scan circuits."

Irith Pomeranz, Sudhakar M. Reddy (2010)

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DOI: 10.1049/IET-CDT.2009.0110

access: closed

type: Journal Article

metadata version: 2020-07-14

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Irith Pomeranz, Sudhakar M. Reddy:
Static test compaction for diagnostic test sets of full-scan circuits. IET Comput. Digit. Tech. 4(5): 365-373 (2010)

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