"Worst-case and average-case analysis of n-detection test sets and test ..."

Irith Pomeranz, Sudhakar M. Reddy (2007)

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DOI: 10.1049/IET-CDT:20060120

access: closed

type: Journal Article

metadata version: 2020-07-14

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Irith Pomeranz, Sudhakar M. Reddy:
Worst-case and average-case analysis of n-detection test sets and test generation strategies. IET Comput. Digit. Tech. 1(4): 353-363 (2007)

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