"On Test Compaction Objectives for Combinational and Sequential Circuits."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/ICVD.1998.646618

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Sudhakar M. Reddy:
On Test Compaction Objectives for Combinational and Sequential Circuits. VLSI Design 1998: 279-284

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