"The Cut Delay Fault Model for Guiding the Generation of n-Detection Test ..."

Irith Pomeranz, Sudhakar M. Reddy (2006)

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DOI: 10.1109/VLSID.2006.160

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Sudhakar M. Reddy:
The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults. VLSI Design 2006: 828-831

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