"Impact of Temperature on Test Quality."

Lavanya Jagan et al. (2010)

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DOI: 10.1109/VLSI.DESIGN.2010.49

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti:
Impact of Temperature on Test Quality. VLSI Design 2010: 276-281

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